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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/DongWWLGYHXSW12>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Bo_Shen>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/C._P._Wen>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Fujun_Xu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Jinyan_Wang>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Min_Yu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Rumin_Gong>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Shenghou_Liu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Yangyuan_Wang>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Yilong_Hao>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Zhihua_Dong>
foaf:homepage <http://dx.doi.org/10.1016%2Fj.microrel.2011.09.021>
foaf:homepage <http://dx.doi.org/10.1016/j.microrel.2011.09.021>
dc:identifier DBLP journals/mr/DongWWLGYHXSW12 (xsd:string)
dc:identifier DOI 10.1016%2Fj.microrel.2011.09.021 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Bo_Shen>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/C._P._Wen>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Fujun_Xu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Jinyan_Wang>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Min_Yu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Rumin_Gong>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Shenghou_Liu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Yangyuan_Wang>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Yilong_Hao>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Zhihua_Dong>
swrc:number 2 (xsd:string)
swrc:pages 434-438 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/DongWWLGYHXSW12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/DongWWLGYHXSW12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr52.html#DongWWLGYHXSW12>
rdfs:seeAlso <http://dx.doi.org/10.1016/j.microrel.2011.09.021>
dc:title High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)