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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/DouglasCGHJLKJVRP12>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/B._P._Gila>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/C._Y._Chang>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/E._A._Douglas>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Fan_Ren>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/G._D._Via>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Jinhyung_Kim>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/K._S._Jones>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/L._Liu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/M._R._Holzworth>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/S._J._Pearton>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Soohwan_Jang>
foaf:homepage <http://dx.doi.org/10.1016%2Fj.microrel.2011.09.018>
foaf:homepage <http://dx.doi.org/10.1016/j.microrel.2011.09.018>
dc:identifier DBLP journals/mr/DouglasCGHJLKJVRP12 (xsd:string)
dc:identifier DOI 10.1016%2Fj.microrel.2011.09.018 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/B._P._Gila>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/C._Y._Chang>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/E._A._Douglas>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Fan_Ren>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/G._D._Via>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Jinhyung_Kim>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/K._S._Jones>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/L._Liu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/M._R._Holzworth>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/S._J._Pearton>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Soohwan_Jang>
swrc:number 1 (xsd:string)
swrc:pages 23-28 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/DouglasCGHJLKJVRP12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/DouglasCGHJLKJVRP12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr52.html#DouglasCGHJLKJVRP12>
rdfs:seeAlso <http://dx.doi.org/10.1016/j.microrel.2011.09.018>
dc:title Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)