[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/MeeDTKG11>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/J._K._Mee>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/L._Trombetta>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/P._Gouker>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/R._A._B._Devine>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/R._J._Kaplar>
foaf:homepage <http://dx.doi.org/10.1016%2Fj.microrel.2011.02.003>
foaf:homepage <http://dx.doi.org/10.1016/j.microrel.2011.02.003>
dc:identifier DBLP journals/mr/MeeDTKG11 (xsd:string)
dc:identifier DOI 10.1016%2Fj.microrel.2011.02.003 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Anomalous drain voltage dependence in bias temperature instability measurements on high-κ field effect transistors. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/J._K._Mee>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/L._Trombetta>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/P._Gouker>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/R._A._B._Devine>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/R._J._Kaplar>
swrc:number 6 (xsd:string)
swrc:pages 1113-1117 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/MeeDTKG11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/MeeDTKG11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr51.html#MeeDTKG11>
rdfs:seeAlso <http://dx.doi.org/10.1016/j.microrel.2011.02.003>
dc:title Anomalous drain voltage dependence in bias temperature instability measurements on high-κ field effect transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)