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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/TyaginovSEJPSOCG11>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/C._Jungemann>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/E._Seebacher>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Hajdin_Ceric>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Hubert_Enichlmair>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Ivan_Starkov>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/J._M._Park>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/R._L._de_Orio>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Stanislav_Tyaginov>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
foaf:homepage <http://dx.doi.org/10.1016%2Fj.microrel.2011.07.089>
foaf:homepage <http://dx.doi.org/10.1016/j.microrel.2011.07.089>
dc:identifier DBLP journals/mr/TyaginovSEJPSOCG11 (xsd:string)
dc:identifier DOI 10.1016%2Fj.microrel.2011.07.089 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label An analytical approach for physical modeling of hot-carrier induced degradation. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/C._Jungemann>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/E._Seebacher>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Hajdin_Ceric>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Hubert_Enichlmair>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Ivan_Starkov>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/J._M._Park>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/R._L._de_Orio>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Stanislav_Tyaginov>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
swrc:number 9-11 (xsd:string)
swrc:pages 1525-1529 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/TyaginovSEJPSOCG11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/TyaginovSEJPSOCG11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr51.html#TyaginovSEJPSOCG11>
rdfs:seeAlso <http://dx.doi.org/10.1016/j.microrel.2011.07.089>
dc:title An analytical approach for physical modeling of hot-carrier induced degradation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)