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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ZadeSKSATNSNHSI11>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/A._Nishiyama>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/A._Srivastava>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Chandan_Kumar_Sarkar>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/D._Zade>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Hiroshi_Iwai>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Kazuo_Tsutsui>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Kenji_Natori>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Kuniyuki_Kakushima>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Nobuyuki_Sugii>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Parhat_Ahmet>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Soshi_Sato>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Takeo_Hattori>
foaf:homepage <http://dx.doi.org/10.1016%2Fj.microrel.2010.11.004>
foaf:homepage <http://dx.doi.org/10.1016/j.microrel.2010.11.004>
dc:identifier DBLP journals/mr/ZadeSKSATNSNHSI11 (xsd:string)
dc:identifier DOI 10.1016%2Fj.microrel.2010.11.004 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/A._Nishiyama>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/A._Srivastava>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Chandan_Kumar_Sarkar>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/D._Zade>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Hiroshi_Iwai>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Kazuo_Tsutsui>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Kenji_Natori>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Kuniyuki_Kakushima>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Nobuyuki_Sugii>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Parhat_Ahmet>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Soshi_Sato>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Takeo_Hattori>
swrc:number 4 (xsd:string)
swrc:pages 746-750 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ZadeSKSATNSNHSI11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ZadeSKSATNSNHSI11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr51.html#ZadeSKSATNSNHSI11>
rdfs:seeAlso <http://dx.doi.org/10.1016/j.microrel.2010.11.004>
dc:title Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)