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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ZhangLLARB11>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Emrah_Acar>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Frank_Liu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Rob_A._Rutenbar>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Ronald_D._Blanton>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Wangyang_Zhang>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Xin_Li>
foaf:homepage <http://dx.doi.org/10.1109%2FTCAD.2011.2164536>
foaf:homepage <http://dx.doi.org/10.1109/TCAD.2011.2164536>
dc:identifier DBLP journals/tcad/ZhangLLARB11 (xsd:string)
dc:identifier DOI 10.1109%2FTCAD.2011.2164536 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Emrah_Acar>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Frank_Liu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Rob_A._Rutenbar>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Ronald_D._Blanton>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Wangyang_Zhang>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Xin_Li>
swrc:number 12 (xsd:string)
swrc:pages 1814-1827 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ZhangLLARB11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ZhangLLARB11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad30.html#ZhangLLARB11>
rdfs:seeAlso <http://dx.doi.org/10.1109/TCAD.2011.2164536>
dc:title Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)