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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/LiMCDMSMJVSS12>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Alan_Rolf_Mickelson>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Brian_Schwartz>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Eric_Dudley>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Ke_Meng>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Li_Shang>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Manish_Vachharajani>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Moustafa_Mohamed>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Russ_Joseph>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Xi_Chen>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Yihe_Sun>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Zheng_Li>
foaf:homepage <http://dx.doi.org/10.1109%2FTVLSI.2010.2089072>
foaf:homepage <http://dx.doi.org/10.1109/TVLSI.2010.2089072>
dc:identifier DBLP journals/tvlsi/LiMCDMSMJVSS12 (xsd:string)
dc:identifier DOI 10.1109%2FTVLSI.2010.2089072 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Reliability Modeling and Management of Nanophotonic On-Chip Networks. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Alan_Rolf_Mickelson>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Brian_Schwartz>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Eric_Dudley>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Ke_Meng>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Li_Shang>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Manish_Vachharajani>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Moustafa_Mohamed>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Russ_Joseph>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Xi_Chen>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Yihe_Sun>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Zheng_Li>
swrc:number 1 (xsd:string)
swrc:pages 98-111 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/LiMCDMSMJVSS12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/LiMCDMSMJVSS12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi20.html#LiMCDMSMJVSS12>
rdfs:seeAlso <http://dx.doi.org/10.1109/TVLSI.2010.2089072>
dc:title Reliability Modeling and Management of Nanophotonic On-Chip Networks. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)