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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/WuZNNLGRNX12>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Chandra_Nimmagadda>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Durodami_Lisk>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Mark_Nakamoto>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Matt_Nowak>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Riko_Radojcic>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Sam_Gu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Wei_Zhao>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Xiaoxia_Wu>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Yuan_Xie>
foaf:homepage <http://dx.doi.org/10.1109%2FTVLSI.2010.2090049>
foaf:homepage <http://dx.doi.org/10.1109/TVLSI.2010.2090049>
dc:identifier DBLP journals/tvlsi/WuZNNLGRNX12 (xsd:string)
dc:identifier DOI 10.1109%2FTVLSI.2010.2090049 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Electrical Characterization for Intertier Connections and Timing Analysis for 3-D ICs. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Chandra_Nimmagadda>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Durodami_Lisk>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Mark_Nakamoto>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Matt_Nowak>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Riko_Radojcic>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Sam_Gu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Wei_Zhao>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Xiaoxia_Wu>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Yuan_Xie>
swrc:number 1 (xsd:string)
swrc:pages 186-191 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/WuZNNLGRNX12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/WuZNNLGRNX12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi20.html#WuZNNLGRNX12>
rdfs:seeAlso <http://dx.doi.org/10.1109/TVLSI.2010.2090049>
dc:title Electrical Characterization for Intertier Connections and Timing Analysis for 3-D ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)