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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/books/sp/15/KhalidAHA15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jahanzeb_Anwer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nor_Hisham_Hamid>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Usman_Khalid>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vijanth_S._Asirvadam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-319-20071-2%5F9>
foaf:homepage <https://doi.org/10.1007/978-3-319-20071-2_9>
dc:identifier DBLP books/sp/15/KhalidAHA15 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-319-20071-2%5F9 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label The Impact of Sensitive Inputs on the Reliability of Nanoscale Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jahanzeb_Anwer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nor_Hisham_Hamid>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Usman_Khalid>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vijanth_S._Asirvadam>
swrc:pages 249-269 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/books/sp/2015FTS>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/books/sp/15/KhalidAHA15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/books/sp/15/KhalidAHA15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/books/collections/FTS2015.html#KhalidAHA15>
rdfs:seeAlso <https://doi.org/10.1007/978-3-319-20071-2_9>
swrc:series <https://dblp.l3s.de/d2r/resource/collections/sp/15>
dc:title The Impact of Sensitive Inputs on the Reliability of Nanoscale Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InCollection
rdf:type foaf:Document