Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design - A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Resource URI: https://dblp.l3s.de/d2r/resource/publications/books/sp/LiYL23
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ISBN 978-981-19-8550-8
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2023
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Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design - A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
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1-304
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Springer
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Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design - A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
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