Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/3dic/KonishiYH11
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/3dic/KonishiYH11
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tomoaki_Konishi
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F3DIC.2012.6262968
>
foaf:
homepage
<
https://doi.org/10.1109/3DIC.2012.6262968
>
dc:
identifier
DBLP conf/3dic/KonishiYH11
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F3DIC.2012.6262968
(xsd:string)
dcterms:
issued
2011
(xsd:gYear)
rdfs:
label
Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tomoaki_Konishi
>
swrc:
pages
1-6
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/3dic/2011
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/3dic/KonishiYH11/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/3dic/KonishiYH11
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#KonishiYH11
>
rdfs:
seeAlso
<
https://doi.org/10.1109/3DIC.2012.6262968
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/3dic
>
dc:
title
Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document