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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ACMse/Barbour92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_E._Barbour>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F503720.503807>
foaf:homepage <https://doi.org/10.1145/503720.503807>
dc:identifier DBLP conf/ACMse/Barbour92 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F503720.503807 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
rdfs:label Test patterns for fault-tolerant logic circuits using block design concepts. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_E._Barbour>
swrc:pages 228-235 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ACMse/1992>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ACMse/Barbour92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ACMse/Barbour92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ACMse/ACMse1992.html#Barbour92>
rdfs:seeAlso <https://doi.org/10.1145/503720.503807>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ACMse>
dc:subject Block Design, Fault-Tolerant Design, Redundancy, System and Gate level, Testing and Testability (xsd:string)
dc:title Test patterns for fault-tolerant logic circuits using block design concepts. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document