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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/IEEEares/InoueYH06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daisuke_Hagiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroto_Yasuura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sozo_Inoue>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FARES.2006.128>
foaf:homepage <https://doi.org/10.1109/ARES.2006.128>
dc:identifier DBLP conf/IEEEares/InoueYH06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FARES.2006.128 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Systematic Error Detection for RFID Reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daisuke_Hagiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroto_Yasuura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sozo_Inoue>
swrc:pages 280-286 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/IEEEares/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/IEEEares/InoueYH06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/IEEEares/InoueYH06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/IEEEares/ares2006.html#InoueYH06>
rdfs:seeAlso <https://doi.org/10.1109/ARES.2006.128>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/IEEEares>
dc:title Systematic Error Detection for RFID Reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document