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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aPcsac/YiCPKE07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_M._Eltawil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fadi_J._Kurdahi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kang_Yi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shih-Yang_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young-Hwan_Park>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-74309-5%5F12>
foaf:homepage <https://doi.org/10.1007/978-3-540-74309-5_12>
dc:identifier DBLP conf/aPcsac/YiCPKE07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-540-74309-5%5F12 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label An Alternative Organization of Defect Map for Defect-Resilient Embedded On-Chip Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_M._Eltawil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fadi_J._Kurdahi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kang_Yi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shih-Yang_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young-Hwan_Park>
swrc:pages 102-113 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aPcsac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aPcsac/YiCPKE07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aPcsac/YiCPKE07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aPcsac/aPcsac2007.html#YiCPKE07>
rdfs:seeAlso <https://doi.org/10.1007/978-3-540-74309-5_12>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aPcsac>
dc:subject Embedded memory Yield; Defect Map; Memory Error Resilient Design; Video error concealment (xsd:string)
dc:title An Alternative Organization of Defect Map for Defect-Resilient Embedded On-Chip Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document