Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/aicas/HirtzlinBKNVPQ19
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/aicas/HirtzlinBKNVPQ19
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Damien_Querlioz
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Elisa_Vianello
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Etienne_Nowak
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jacques-Olivier_Klein
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jean-Michel_Portal
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marc_Bocquet
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tifenn_Hirtzlin
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FAICAS.2019.8771544
>
foaf:
homepage
<
https://doi.org/10.1109/AICAS.2019.8771544
>
dc:
identifier
DBLP conf/aicas/HirtzlinBKNVPQ19
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FAICAS.2019.8771544
(xsd:string)
dcterms:
issued
2019
(xsd:gYear)
rdfs:
label
Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Damien_Querlioz
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Elisa_Vianello
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Etienne_Nowak
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jacques-Olivier_Klein
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jean-Michel_Portal
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marc_Bocquet
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tifenn_Hirtzlin
>
swrc:
pages
288-292
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/aicas/2019
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/aicas/HirtzlinBKNVPQ19/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/aicas/HirtzlinBKNVPQ19
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/aicas/aicas2019.html#HirtzlinBKNVPQ19
>
rdfs:
seeAlso
<
https://doi.org/10.1109/AICAS.2019.8771544
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/aicas
>
dc:
title
Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document