Convolutional AutoEncoders for Anomaly Detection in Semiconductor Manufacturing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/aics/GormanDMC23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/aics/GormanDMC23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Damien_Coyle
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Liam_P._Maguire
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mark_Gorman
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xuemei_Ding
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FAICS60730.2023.10470831
>
foaf:
homepage
<
https://doi.org/10.1109/AICS60730.2023.10470831
>
dc:
identifier
DBLP conf/aics/GormanDMC23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FAICS60730.2023.10470831
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Convolutional AutoEncoders for Anomaly Detection in Semiconductor Manufacturing.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Damien_Coyle
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Liam_P._Maguire
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mark_Gorman
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xuemei_Ding
>
swrc:
pages
1-6
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/aics/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/aics/GormanDMC23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/aics/GormanDMC23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/aics/aics2023.html#GormanDMC23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/AICS60730.2023.10470831
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/aics
>
dc:
title
Convolutional AutoEncoders for Anomaly Detection in Semiconductor Manufacturing.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document