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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aimech/TsuruyaDSHT19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katsuhiko_Sasaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Musashi_Danseko>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ryo_Takeda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinya_Honda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomohiro_Tsuruya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAIM.2019.8868512>
foaf:homepage <https://doi.org/10.1109/AIM.2019.8868512>
dc:identifier DBLP conf/aimech/TsuruyaDSHT19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAIM.2019.8868512 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Process monitoring of deep drawing using machine learning. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katsuhiko_Sasaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Musashi_Danseko>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ryo_Takeda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinya_Honda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomohiro_Tsuruya>
swrc:pages 1227-1232 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aimech/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aimech/TsuruyaDSHT19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aimech/TsuruyaDSHT19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aimech/aim2019.html#TsuruyaDSHT19>
rdfs:seeAlso <https://doi.org/10.1109/AIM.2019.8868512>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aimech>
dc:title Process monitoring of deep drawing using machine learning. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document