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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aimlr/HoY23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Yuan_Ho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong-Sheng_Yang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3625343.3625345>
foaf:homepage <https://doi.org/10.1145/3625343.3625345>
dc:identifier DBLP conf/aimlr/HoY23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3625343.3625345 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Mask Defect Detection: A Journey through Real-World Applications of CNN-based Models. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Yuan_Ho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong-Sheng_Yang>
swrc:pages 2:1-2:5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aimlr/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aimlr/HoY23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aimlr/HoY23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aimlr/aimlr2023.html#HoY23>
rdfs:seeAlso <https://doi.org/10.1145/3625343.3625345>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aimlr>
dc:title Mask Defect Detection: A Journey through Real-World Applications of CNN-based Models. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document