| Property | Value |
|---|
|
dcterms:bibliographicCitation
|
<http://dblp.uni-trier.de/rec/bibtex/conf/aitest/2022>
|
|
foaf:homepage
|
<http://dx.doi.org/doi.org%2F10.1109%2FAITest55621.2022>
|
|
foaf:homepage
|
<https://doi.org/10.1109/AITest55621.2022>
|
|
dc:identifier
|
DBLP conf/aitest/2022
(xsd:string)
|
|
dc:identifier
|
DOI doi.org%2F10.1109%2FAITest55621.2022
(xsd:string)
|
|
dc:identifier
|
ISBN 978-1-6654-8737-5
(xsd:string)
|
|
swrc:isbn
|
ISBN 978-1-6654-8737-5
(xsd:string)
|
|
dcterms:issued
|
2022
(xsd:gYear)
|
|
rdfs:label
|
IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022
(xsd:string)
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/AhmedN22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/Al-QadasiWFB22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/BulduSSK22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/GambiNAF22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/GaoLTHAJSN22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/JagannathanCDPE22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/LiTGG22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/LiaoZC22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/LiuZGLC22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/MasambaEB22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/MasambaEB22a>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/MuhlburgerW22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/RehmanI22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/ShreeCLKK22>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/aitest/ZhuBG22>
|
|
dc:publisher
|
IEEE
(xsd:string)
|
|
owl:sameAs
|
<http://bibsonomy.org/uri/bibtexkey/conf/aitest/2022/dblp>
|
|
owl:sameAs
|
<http://dblp.rkbexplorer.com/id/conf/aitest/2022>
|
|
owl:sameAs
|
<urn:isbn:978-1-6654-8737-5>
|
|
rdfs:seeAlso
|
<http://amazon.com/s/ref=nb_ss_gw?field-keywords=978-1-6654-8737-5>
|
|
rdfs:seeAlso
|
<https://doi.org/10.1109/AITest55621.2022>
|
|
swrc:series
|
<https://dblp.l3s.de/d2r/resource/conferences/aitest>
|
|
dcterms:tableOfContent
|
<http://dblp.uni-trier.de/db/conf/aitest/aitest2022.html>
|
|
dc:title
|
IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022
(xsd:string)
|
|
dc:type
|
<http://purl.org/dc/dcmitype/Collection>
|
|
rdf:type
|
swrc:Proceedings
|
|
rdf:type
|
foaf:Document
|
![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)