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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/apccas/ChenKHJL08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geeng-Lih_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Yi_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yeh-Jen_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yeh-Ning_Jou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAPCCAS.2008.4745960>
foaf:homepage <https://doi.org/10.1109/APCCAS.2008.4745960>
dc:identifier DBLP conf/apccas/ChenKHJL08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAPCCAS.2008.4745960 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geeng-Lih_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Yi_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yeh-Jen_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yeh-Ning_Jou>
swrc:pages 61-64 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/APCCAS.2008.4745960>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/apccas>
dc:title Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document