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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/apccas/ChenY08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Ting_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shih-Hung_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAPCCAS.2008.4745959>
foaf:homepage <https://doi.org/10.1109/APCCAS.2008.4745959>
dc:identifier DBLP conf/apccas/ChenY08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAPCCAS.2008.4745959 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Ting_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shih-Hung_Chen>
swrc:pages 57-60 (xsd:string)
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owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/apccas/ChenY08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/apccas/ChenY08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/apccas/apccas2008.html#ChenY08>
rdfs:seeAlso <https://doi.org/10.1109/APCCAS.2008.4745959>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/apccas>
dc:title Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document