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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/apccas/HsuCCSLCC08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Che-Hung_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Ti_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Fang_Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Po-An_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shu-Chuan_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yen-Hsien_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu-Ti_Su>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAPCCAS.2008.4745957>
foaf:homepage <https://doi.org/10.1109/APCCAS.2008.4745957>
dc:identifier DBLP conf/apccas/HsuCCSLCC08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAPCCAS.2008.4745957 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Che-Hung_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Ti_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Fang_Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Po-An_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shu-Chuan_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yen-Hsien_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu-Ti_Su>
swrc:pages 49-52 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/apccas/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/apccas/HsuCCSLCC08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/apccas/HsuCCSLCC08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/apccas/apccas2008.html#HsuCCSLCC08>
rdfs:seeAlso <https://doi.org/10.1109/APCCAS.2008.4745957>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/apccas>
dc:title Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document