Topology-related effects of Gated-Vdd and Gated-Vss techniques on full-adder leakage and delay at 65nm and 45 nm.
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Topology-related effects of Gated-Vdd and Gated-Vss techniques on full-adder leakage and delay at 65nm and 45 nm.
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Topology-related effects of Gated-Vdd and Gated-Vss techniques on full-adder leakage and delay at 65nm and 45 nm.
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