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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/apccas/NedalgiS21a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dharmaray_Nedalgi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saroja_V._Siddamal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAPCCAS51387.2021.9687809>
foaf:homepage <https://doi.org/10.1109/APCCAS51387.2021.9687809>
dc:identifier DBLP conf/apccas/NedalgiS21a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAPCCAS51387.2021.9687809 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label $2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dharmaray_Nedalgi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saroja_V._Siddamal>
swrc:pages 97-100 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/apccas/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/apccas/NedalgiS21a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/apccas/NedalgiS21a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/apccas/apccas2021.html#NedalgiS21a>
rdfs:seeAlso <https://doi.org/10.1109/APCCAS51387.2021.9687809>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/apccas>
dc:title $2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document