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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/apccas/ZhangZWLLNF10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dejun_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guohua_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haipeng_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liang_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lingyan_Fan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mi_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoyan_Niu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAPCCAS.2010.5775049>
foaf:homepage <https://doi.org/10.1109/APCCAS.2010.5775049>
dc:identifier DBLP conf/apccas/ZhangZWLLNF10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAPCCAS.2010.5775049 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dejun_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guohua_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haipeng_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liang_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lingyan_Fan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mi_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoyan_Niu>
swrc:pages 1227-1230 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/apccas/2010>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/apccas/apccas2010.html#ZhangZWLLNF10>
rdfs:seeAlso <https://doi.org/10.1109/APCCAS.2010.5775049>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/apccas>
dc:title Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document