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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/applepies/CiarpiSMP18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Palla>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gabriele_Ciarpi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Magazz%E2%88%9A%C4%BB>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sergio_Saponara>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-030-11973-7%5F31>
foaf:homepage <https://doi.org/10.1007/978-3-030-11973-7_31>
dc:identifier DBLP conf/applepies/CiarpiSMP18 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-030-11973-7%5F31 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Radiation Hardness by Design Techniques for 1 Grad TID Rad-Hard Systems in 65 nm Standard CMOS Technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Palla>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gabriele_Ciarpi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Magazz%E2%88%9A%C4%BB>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sergio_Saponara>
swrc:pages 269-276 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/applepies/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/applepies/CiarpiSMP18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/applepies/CiarpiSMP18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/applepies/applepies2018.html#CiarpiSMP18>
rdfs:seeAlso <https://doi.org/10.1007/978-3-030-11973-7_31>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/applepies>
dc:title Radiation Hardness by Design Techniques for 1 Grad TID Rad-Hard Systems in 65 nm Standard CMOS Technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document