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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/apsipa/SongSPWZM20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dingkai_Susun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hui_Ma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Pan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shengli_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuxin_Song>
foaf:homepage <https://ieeexplore.ieee.org/document/9306481>
dc:identifier DBLP conf/apsipa/SongSPWZM20 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Small Data-Driven Electrical Insulator Defect Detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dingkai_Susun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hui_Ma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Pan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shengli_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuxin_Song>
swrc:pages 1725-1729 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/apsipa/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/apsipa/SongSPWZM20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/apsipa/SongSPWZM20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/apsipa/apsipa2020.html#SongSPWZM20>
rdfs:seeAlso <https://ieeexplore.ieee.org/document/9306481>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/apsipa>
dc:title Small Data-Driven Electrical Insulator Defect Detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document