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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aqtr/SiposOI22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexandra_Ones>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emilia_Sipos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Laura-Nicoleta_Ivanciu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FAQTR55203.2022.9802021>
foaf:homepage <https://doi.org/10.1109/AQTR55203.2022.9802021>
dc:identifier DBLP conf/aqtr/SiposOI22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FAQTR55203.2022.9802021 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label PCB Quality Check: Optical Inspection Using Color Mask and Thresholding. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexandra_Ones>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emilia_Sipos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Laura-Nicoleta_Ivanciu>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aqtr/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aqtr/SiposOI22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aqtr/SiposOI22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aqtr/aqtr2022.html#SiposOI22>
rdfs:seeAlso <https://doi.org/10.1109/AQTR55203.2022.9802021>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aqtr>
dc:title PCB Quality Check: Optical Inspection Using Color Mask and Thresholding. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document