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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/arith/BederrNG95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alain_Guyot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hakim_Bederr>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FARITH.1995.465380>
foaf:homepage <https://doi.org/10.1109/ARITH.1995.465380>
dc:identifier DBLP conf/arith/BederrNG95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FARITH.1995.465380 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Analytic approach for error masking elimination in on-line multipliers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alain_Guyot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hakim_Bederr>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
swrc:pages 30-37 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/arith/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/arith/BederrNG95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/arith/BederrNG95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/arith/arith1995.html#BederrNG95>
rdfs:seeAlso <https://doi.org/10.1109/ARITH.1995.465380>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/arith>
dc:subject multiplying circuits; digital arithmetic; error masking elimination; online multipliers; sequential circuits; high precision numbers; scan design approach; internal state observability; fault coverage; DFT approach; area overhead (xsd:string)
dc:title Analytic approach for error masking elimination in on-line multipliers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document