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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/arvlsi/MorrisWD95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Denise_M._Wilson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephen_P._DeWeerth>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tonia_G._Morris>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FARVLSI.1995.515624>
foaf:homepage <https://doi.org/10.1109/ARVLSI.1995.515624>
dc:identifier DBLP conf/arvlsi/MorrisWD95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FARVLSI.1995.515624 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Analog VLSI circuits for manufacturing inspection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Denise_M._Wilson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephen_P._DeWeerth>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tonia_G._Morris>
swrc:pages 241-257 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/arvlsi/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/arvlsi/MorrisWD95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/arvlsi/MorrisWD95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/arvlsi/arvlsi1995.html#MorrisWD95>
rdfs:seeAlso <https://doi.org/10.1109/ARVLSI.1995.515624>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/arvlsi>
dc:subject automatic optical inspection; VLSI; CMOS analogue integrated circuits; manufacture; edge detection; mathematical morphology; computer vision; analogue processing circuits; focal planes; analog VLSI circuits; manufacturing inspection; morphological operations; programmable structuring elements; oriented edge detection; high speed preprocessors; selective attention; serial/parallel processing; machine vision; focal-plane processing; massively parallel architectures; vertical bipolar phototransistors; digital CMOS process; adaptive image threshold; 2.0 micron (xsd:string)
dc:title Analog VLSI circuits for manufacturing inspection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document