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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/arvlsi/VoorakaranamC99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ramakrishna_Voorakaranam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FARVLSI.1999.756058>
foaf:homepage <https://doi.org/10.1109/ARVLSI.1999.756058>
dc:identifier DBLP conf/arvlsi/VoorakaranamC99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FARVLSI.1999.756058 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ramakrishna_Voorakaranam>
swrc:pages 342-357 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/arvlsi/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/arvlsi/VoorakaranamC99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/arvlsi/VoorakaranamC99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/arvlsi/arvlsi1999.html#VoorakaranamC99>
rdfs:seeAlso <https://doi.org/10.1109/ARVLSI.1999.756058>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/arvlsi>
dc:subject Backtrace, test generation, fault diagnosis, analog testing, analog verification. (xsd:string)
dc:title Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document