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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin_Soo_Noh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kang_Hyeon_Rhee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-30585-9%5F23>
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dc:identifier DOI doi.org%2F10.1007%2F978-3-540-30585-9%5F23 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Path Sensitization and Sub-circuit Partition of CUT Using t-Distribution for Pseudo-exhaustive Testing. (xsd:string)
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swrc:pages 205-213 (xsd:string)
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dc:title Path Sensitization and Sub-circuit Partition of CUT Using t-Distribution for Pseudo-exhaustive Testing. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document