[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asicon/JiangQCC11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lele_Jiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lifu_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaojing_Qin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuhua_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASICON.2011.6157339>
foaf:homepage <https://doi.org/10.1109/ASICON.2011.6157339>
dc:identifier DBLP conf/asicon/JiangQCC11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASICON.2011.6157339 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Characterization and analysis of pattern dependent variation-aware interconnects for a 65nm technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lele_Jiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lifu_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaojing_Qin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuhua_Cheng>
swrc:pages 854-857 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/asicon/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asicon/JiangQCC11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asicon/JiangQCC11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#JiangQCC11>
rdfs:seeAlso <https://doi.org/10.1109/ASICON.2011.6157339>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asicon>
dc:title Characterization and analysis of pattern dependent variation-aware interconnects for a 65nm technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document