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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asicon/JinGNTHH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baohua_Tian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Niannian_Ge>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Jin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruifen_Nie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiamin_Hao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASICON58565.2023.10396443>
foaf:homepage <https://doi.org/10.1109/ASICON58565.2023.10396443>
dc:identifier DBLP conf/asicon/JinGNTHH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASICON58565.2023.10396443 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Optimal design of short circuit robustness for high voltage and high power IGBTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baohua_Tian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Niannian_Ge>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Jin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruifen_Nie>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiamin_Hao>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/asicon/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asicon/JinGNTHH23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asicon/JinGNTHH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asicon/asicon2023.html#JinGNTHH23>
rdfs:seeAlso <https://doi.org/10.1109/ASICON58565.2023.10396443>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asicon>
dc:title Optimal design of short circuit robustness for high voltage and high power IGBTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document