[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asicon/LinCCZC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haoyu_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianwen_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Linlin_Cai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wangyong_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yutao_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASICON58565.2023.10396190>
foaf:homepage <https://doi.org/10.1109/ASICON58565.2023.10396190>
dc:identifier DBLP conf/asicon/LinCCZC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASICON58565.2023.10396190 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haoyu_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianwen_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Linlin_Cai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wangyong_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yutao_Chen>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/asicon/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asicon/LinCCZC23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asicon/LinCCZC23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asicon/asicon2023.html#LinCCZC23>
rdfs:seeAlso <https://doi.org/10.1109/ASICON58565.2023.10396190>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asicon>
dc:title Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document