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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asicon/WangMSS17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_H._Stathis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miaomiao_Wang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_G._Southwick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xin_Miao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASICON.2017.8252563>
foaf:homepage <https://doi.org/10.1109/ASICON.2017.8252563>
dc:identifier DBLP conf/asicon/WangMSS17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASICON.2017.8252563 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Hot carrier reliability in ultra-scaled sige channel p-FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_H._Stathis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miaomiao_Wang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_G._Southwick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xin_Miao>
swrc:pages 666-669 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/asicon/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asicon/WangMSS17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asicon/WangMSS17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asicon/asicon2017.html#WangMSS17>
rdfs:seeAlso <https://doi.org/10.1109/ASICON.2017.8252563>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asicon>
dc:title Hot carrier reliability in ultra-scaled sige channel p-FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document