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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kai_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoyong_Xue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yanqing_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yinyin_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASICON.2015.7517139>
foaf:homepage <https://doi.org/10.1109/ASICON.2015.7517139>
dc:identifier DBLP conf/asicon/YangZYXLB15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASICON.2015.7517139 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianguo_Yang>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kai_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoyong_Xue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yanqing_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yinyin_Lin>
swrc:pages 1-4 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ASICON.2015.7517139>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asicon>
dc:title Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document