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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asicon/ZhangDJZ17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianfu_Zhang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Duan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weidong_Zhang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASICON.2017.8252564>
foaf:homepage <https://doi.org/10.1109/ASICON.2017.8252564>
dc:identifier DBLP conf/asicon/ZhangDJZ17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASICON.2017.8252564 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianfu_Zhang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Duan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weidong_Zhang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
swrc:pages 670-673 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/asicon/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asicon/ZhangDJZ17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asicon/ZhangDJZ17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asicon/asicon2017.html#ZhangDJZ17>
rdfs:seeAlso <https://doi.org/10.1109/ASICON.2017.8252564>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asicon>
dc:title Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document