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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/GengSCXHY23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bei_Yu_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Geng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qi_Sun_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qi_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tinghuan_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Yi_Ho>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3566097.3568363>
foaf:homepage <https://doi.org/10.1145/3566097.3568363>
dc:identifier DBLP conf/aspdac/GengSCXHY23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3566097.3568363 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Mixed-Type Wafer Failure Pattern Recognition. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bei_Yu_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Geng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qi_Sun_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qi_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tinghuan_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Yi_Ho>
swrc:pages 727-732 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/GengSCXHY23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/GengSCXHY23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2023.html#GengSCXHY23>
rdfs:seeAlso <https://doi.org/10.1145/3566097.3568363>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Mixed-Type Wafer Failure Pattern Recognition. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document