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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/GoudarziIY07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroto_Yasuura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maziar_Goudarzi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tohru_Ishihara>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASPDAC.2007.358100>
foaf:homepage <https://doi.org/10.1109/ASPDAC.2007.358100>
dc:identifier DBLP conf/aspdac/GoudarziIY07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASPDAC.2007.358100 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroto_Yasuura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maziar_Goudarzi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tohru_Ishihara>
swrc:pages 878-883 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/GoudarziIY07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/GoudarziIY07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2007.html#GoudarziIY07>
rdfs:seeAlso <https://doi.org/10.1109/ASPDAC.2007.358100>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document