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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/HuangYKI07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Kurokawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Yu_0013>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasuaki_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhangcai_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASPDAC.2007.358046>
foaf:homepage <https://doi.org/10.1109/ASPDAC.2007.358046>
dc:identifier DBLP conf/aspdac/HuangYKI07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASPDAC.2007.358046 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Modeling the Overshooting Effect for CMOS Inverter in Nanometer Technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Kurokawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Yu_0013>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasuaki_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhangcai_Huang>
swrc:pages 565-570 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/HuangYKI07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/HuangYKI07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2007.html#HuangYKI07>
rdfs:seeAlso <https://doi.org/10.1109/ASPDAC.2007.358046>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Modeling the Overshooting Effect for CMOS Inverter in Nanometer Technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document