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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/KimPS07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dusan_Petranovic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngmin_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASPDAC.2007.358028>
foaf:homepage <https://doi.org/10.1109/ASPDAC.2007.358028>
dc:identifier DBLP conf/aspdac/KimPS07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASPDAC.2007.358028 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Simple and Accurate Models for Capacitance Increment due to Metal Fill Insertion. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dusan_Petranovic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngmin_Kim>
swrc:pages 456-461 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/KimPS07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/KimPS07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2007.html#KimPS07>
rdfs:seeAlso <https://doi.org/10.1109/ASPDAC.2007.358028>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:subject benchmark circuits, capacitance increment, metal fill insertion, inter level dielectric thickness planarity, metal dummy, signal capacitance, electrical characteristic, signal dimensions, dummy shape, dummy dimensions, weighting function, simple test patterns (xsd:string)
dc:title Simple and Accurate Models for Capacitance Increment due to Metal Fill Insertion. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document