[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/LeeLWL07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chun-Yi_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fang-Min_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hung-Mao_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_Chien-Mo_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASPDAC.2007.358093>
foaf:homepage <https://doi.org/10.1109/ASPDAC.2007.358093>
dc:identifier DBLP conf/aspdac/LeeLWL07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASPDAC.2007.358093 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chun-Yi_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fang-Min_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hung-Mao_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_Chien-Mo_Li>
swrc:pages 835-840 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/LeeLWL07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/LeeLWL07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2007.html#LeeLWL07>
rdfs:seeAlso <https://doi.org/10.1109/ASPDAC.2007.358093>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:subject systematic defects, nanometer technologies, cyclic-column parity row selection technique, built-in self tested circuits, transient errors, cyclic scan chains, circuit under test, masking circuitry (xsd:string)
dc:title Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document