Correlation method of circuit-performance and technology fluctuations for improved design reliability.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/MiyawakiMMOSMKYYN01
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Correlation method of circuit-performance and technology fluctuations for improved design reliability.
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Correlation method of circuit-performance and technology fluctuations for improved design reliability.
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