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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/NagaoNKEIS23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Eiki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masuo_Kajiyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michihiro_Shintani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuma_Nagao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoki_Nakamura>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3566097.3567915>
foaf:homepage <https://doi.org/10.1145/3566097.3567915>
dc:identifier DBLP conf/aspdac/NagaoNKEIS23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3566097.3567915 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Eiki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masuo_Kajiyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michihiro_Shintani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuma_Nagao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoki_Nakamura>
swrc:pages 442-448 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/NagaoNKEIS23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/NagaoNKEIS23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2023.html#NagaoNKEIS23>
rdfs:seeAlso <https://doi.org/10.1145/3566097.3567915>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document