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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/NagataONMI01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Iwata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin_Nagai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Nagata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takafumi_Ohmoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Morie>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F370155.370209>
foaf:homepage <https://doi.org/10.1145/370155.370209>
dc:identifier DBLP conf/aspdac/NagataONMI01 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F370155.370209 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label Test circuits for substrate noise evaluation in CMOS digital ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Iwata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin_Nagai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Nagata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takafumi_Ohmoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Morie>
swrc:pages 13-14 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2001>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/NagataONMI01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/NagataONMI01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2001.html#NagataONMI01>
rdfs:seeAlso <https://doi.org/10.1145/370155.370209>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Test circuits for substrate noise evaluation in CMOS digital ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document