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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/PuGCH08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Henk_Corporaal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_de_Jesus_Pineda_de_Gyvez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yajun_Ha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Pu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASPDAC.2008.4483935>
foaf:homepage <https://doi.org/10.1109/ASPDAC.2008.4483935>
dc:identifier DBLP conf/aspdac/PuGCH08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASPDAC.2008.4483935 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Statistical noise margin estimation for sub-threshold combinational circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Henk_Corporaal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_de_Jesus_Pineda_de_Gyvez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yajun_Ha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Pu>
swrc:pages 176-179 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/PuGCH08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/PuGCH08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#PuGCH08>
rdfs:seeAlso <https://doi.org/10.1109/ASPDAC.2008.4483935>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Statistical noise margin estimation for sub-threshold combinational circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document