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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/ZhanFWGCXW04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Albert_Z._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haigang_Feng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haolu_Xie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiong_Wu_0013>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rouying_Zhan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaokang_Guan>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FASPDAC.2004.73>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.73>
dc:identifier DBLP conf/aspdac/ZhanFWGCXW04 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FASPDAC.2004.73 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Albert_Z._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haigang_Feng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haolu_Xie>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiong_Wu_0013>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rouying_Zhan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaokang_Guan>
swrc:pages 710-712 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/ZhanFWGCXW04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/ZhanFWGCXW04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2004.html#ZhanFWGCXW04>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.73>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document