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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/aspdac/ZhangWZY19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Yang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rujia_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xianwei_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youtao_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3287624.3287639>
foaf:homepage <https://doi.org/10.1145/3287624.3287639>
dc:identifier DBLP conf/aspdac/ZhangWZY19 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3287624.3287639 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Boosting chipkill capability under retention-error induced reliability emergency. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Yang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rujia_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xianwei_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youtao_Zhang>
swrc:pages 400-405 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/aspdac/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/aspdac/ZhangWZY19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/aspdac/ZhangWZY19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/aspdac/aspdac2019.html#ZhangWZY19>
rdfs:seeAlso <https://doi.org/10.1145/3287624.3287639>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/aspdac>
dc:title Boosting chipkill capability under retention-error induced reliability emergency. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document