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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asscc/YokoyamaITFTMAM14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Miyanishi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazutoshi_Shiba>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keiichi_Maekawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Tanaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinobu_Asayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tatsuya_Fukuda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshiki_Tsujihashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshisato_Yokoyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuichiro_Ishii>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FASSCC.2014.7008851>
foaf:homepage <https://doi.org/10.1109/ASSCC.2014.7008851>
dc:identifier DBLP conf/asscc/YokoyamaITFTMAM14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FASSCC.2014.7008851 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label 40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170¬įC with test screening against write disturb issues. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Miyanishi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazutoshi_Shiba>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keiichi_Maekawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Tanaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinobu_Asayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tatsuya_Fukuda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshiki_Tsujihashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshisato_Yokoyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuichiro_Ishii>
swrc:pages 25-28 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/asscc/2014>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asscc/YokoyamaITFTMAM14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asscc/YokoyamaITFTMAM14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asscc/asscc2014.html#YokoyamaITFTMAM14>
rdfs:seeAlso <https://doi.org/10.1109/ASSCC.2014.7008851>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/asscc>
dc:title 40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170¬įC with test screening against write disturb issues. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document